An ASIC Low Power Primer: Analysis, Techniques and by Rakesh Chadha

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By Rakesh Chadha

This booklet offers a useful primer at the ideas used in the layout of low strength electronic semiconductor units. Readers will enjoy the hands-on method which starts off shape the ground-up, explaining with easy examples what energy is, the way it is measured and the way it affects at the layout means of application-specific built-in circuits (ASICs). The authors use either the Unified strength structure (UPF) and customary energy structure (CPF) to explain intimately the ability reason for an ASIC after which advisor readers via various architectural and implementation thoughts that may support meet the facility motive. From studying method energy intake, to concepts that may be hired in a low energy layout, to a close description of 2 exchange criteria for taking pictures the ability directives at a variety of levels of the layout, this booklet is stuffed with details that might supply ASIC designers a aggressive part in low-power design.

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Extra resources for An ASIC Low Power Primer: Analysis, Techniques and Specification

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0”); } } } The power dissipation tables illustrate that the clock input transitions for the memory read or write operations result in a much higher power dissipation in the memory macro than the activity of other inputs. During the read operation, the output bus Q also switches which results in internal switching as well as output charging power. The internal switching power for the output bus Q is depicted next. 022”); } } } } Note that the output charging power for the output Q bus would depend upon the output capacitive load driven by the Q pins of the memory.

The longer channel devices would have lower performance (larger delays); however the leakage in these cells is lower. 3 4 Standard Vt (SVt) is also sometimes referred to as Regular Vt (RVt). Using representative input slew and output loading. 613 The standard cells built with longer channel devices provide a choice for trading off performance with leakage without changing the threshold of the devices. 2 shows the trade-off between leakage power (for typical process at room temperature) and delays for a buffer cell in a 40 nm process.

The power analysis utilizes the switching activity (static probability and transition rate) for each signal in the design. 3 Examples In Fig. 1, the probability that pins CK and Q are at 1 is 50%. However, the toggle rate for pin CK is 8 toggles in 40 ns, or 200 million transitions per second. The toggle rate for pin Q is 4 toggles in 40 ns, or 100 million transitions per second. A net that has a probability of 1 or 0 is a constant net. 5 is at logic-1 50% of time. This effectively describes the duty cycle of the net.

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